Skip to main content
Back

Information for ruling 600009226

This section is Advance Tariff Ruling

Start date
24 Nov 2023
Expiry date
23 Nov 2026
Description
This product is a unit that is a combined constant current source and digital voltameter. The user can input the desired level of constant current or choose a simple auto ranging function. The unit is used in conjunction with a four-point probe and readings can be used to determine the resistivity of semiconductor samples, typically silicon wafers or thin metal layers. Generally used in research applications the unit can be operated as a standalone unit or can be controlled by a PC using supplied software or by the user writing a program to operate it as required. The unit can also display results from measurements as voltage, as a sheet resistance in ohms per square, or as a resistivity in ohm.cm. Also offering currents between 10nA and 100mA and cannot be adjusted to offer higher or lower currents.
Keywords
  • FOR TESTING
  • SCIENTIFIC ANALYSIS EQUIPMENT
  • ELECTRONIC ASSEMBLIES
  • FOR MEASURING ELECTR. QUANTITIES
Justification
Classification has been determined in accordance with the following: For the purposes of determining the commodity codes within which goods most appropriately fall, reg 3 (1) of The Customs Tariff (Establishment) (EU Exit) Regulations 2020 sets out that the rules of interpretation contained in the following have effect – a. Part Two (Goods Classification Table Rules of Interpretation) of the Tariff of the United Kingdom (Reg 3(1)(a)); and b. Notes to a section or chapter of the Goods Classification Table (Reg 3(1)(b)). GIR 1 has been used to classify this product by the terms of heading 9030 - Oscilloscopes, spectrum analysers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, x-ray, cosmic or other ionising radiation GIR 6 has been used to classify the goods to subheading level 903082 - For measuring or checking semiconductor wafers or devices (including integrated circuits) Also classified in accordance with: Harmonised System Explanatory Notes (HSENs) Note B to heading 9030