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Information for ruling 600015322

This section is Advance Tariff Ruling

Start date
20 Apr 2026
Expiry date
19 Apr 2029
Description
A handheld electronic test instrument designed to identify and characterise discrete semiconductor devices whilst out of circuit. It automatically detects device type, including bipolar junction transistors, MOSFETs, JFETs, diodes, and diode networks, without requiring prior pin configuration. After analysis, the instrument displays pinout identification and key electrical parameters such as junction voltage, current gain (hFE), threshold voltage, and leakage current where applicable. The unit uses three test leads connected directly to the device under test and presents results on an integrated LCD. It is battery powered and supplied in a cardboard box with an instruction manual
Keywords
  • FOR TESTING
  • WITH DISPLAY
  • FOR ANALYSIS
  • ELECTRONIC
  • CHECKING INSTRUMENTS
  • FOR MEASURING ELECTR. QUANTITIES
Justification
Classification has been determined in accordance with the following: For the purposes of determining the commodity codes within which goods most appropriately fall, reg 3 (1) of The Customs Tariff (Establishment) (EU Exit) Regulations 2020 sets out that the rules of interpretation contained in the following have effect – a. Part Two (Goods Classification Table Rules of Interpretation) of the Tariff of the United Kingdom (Reg 3(1)(a)); and b. Notes to a section or chapter of the Goods Classification Table (Reg 3(1)(b)) General interpretative rules (GIR)s: GIR 1 has been used to classify this product by the terms of heading 9030 - Oscilloscopes, spectrum analysers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 9028; instruments and apparatus for measuring or detecting alpha, beta, gamma, x-ray, cosmic or other ionising radiation GIR 5 (b) has been used to identify normal packaging for transport GIR 6 has been used to classify the goods to sub-heading 803082 – Other instruments and apparatus; for measuring or checking semiconductor wafers or devices (including integrated circuits) Also classified in accordance with :- Harmonised Standard Explanatory Notes (HSENs) to heading – 9030